Thermal-Aware Testing of Digital VLSI Circuits and Systems
1696 Kč
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The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--
| Autor: | Chattopadhyay, Santanu (Department of Electronics and Electrical Communication Engineering, Indian Institute of Technolo |
| Nakladatel: | Taylor & Francis Inc |
| ISBN: | 9780815378822 |
| Rok vydání: | 2018 |
| Jazyk : | Angličtina |
| Vazba: | Hardback |
| Počet stran: | 118 |
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