Wafer-Level Testing and Test During Burn-in for Integrated Circuits
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| Autor: | Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu |
| Nakladatel: | Artech House Publishers |
| ISBN: | 9781596939899 |
| Rok vydání: | 2010 |
| Jazyk : | Angličtina |
| Vazba: | Microfilm |
| Počet stran: | 213 |
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