Spectroscopic Ellipsometry for Photovoltaics
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Introduction.- Part I: Application of Ellipsometry Technique.- Analysis of Optical and Recombination Losses in Solar Cells.- Optical Simulation of External Quantum Efficiency Spectra.- Characterization of Textured Structures.- On-line Monitoring of Photovoltaics Production.- Real Time Measurement, Monitoring, and Control of CuIn 1 x Ga x Se 2 by Spectroscopic Ellipsometry.- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells.- Part II: Optical Data of Solar-Cell Component Materials.- Inorganic Semiconductors and Passivation Layers.- Organic Semiconductors.- Organic-Inorganic Hybrid Perovskites.- Transparent Conductive Oxides.- Metals.- Substrates and Coating Layers.
Autor: | Fujiwara, Hiroyuki |
Nakladatel: | Springer, Berlin |
Rok vydání: | 2018 |
Jazyk : | Angličtina |
Vazba: | Hardback |
Počet stran: | 450 |
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