High-Resolution Electron Microscopy
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... essential reading for anyone interested in HREM and its applications in materials characterization. The fourth edition provides much needed updates on aberration correction and the latest developments in electron detection technology and analytical microscopic techniques. Jian-Min Zuo, Microscopy & Microanalysis
| Autor: | Spence, John C. H. |
| Nakladatel: | Oxford University Press |
| Rok vydání: | 2017 |
| Jazyk : | Angličtina |
| Vazba: | Paperback / softback |
| Počet stran: | 432 |
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