Applied Measurement with jMetrik
1302 Kč
Sleva až 70% u třetiny knih
Autor: | Meyer, J. Patrick (University of Virginia, USA) |
Nakladatel: | Taylor & Francis Ltd |
ISBN: | 9780415531979 |
Rok vydání: | 2014 |
Jazyk : | Angličtina |
Vazba: | Paperback |
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