Scanning Electron Microscopy and X-ray Microanalysis
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An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
| Autor: | Goldstein Joseph |
| Nakladatel: | Springer Science+Business Media |
| ISBN: | 9780306472923 |
| Rok vydání: | 2007 |
| Jazyk : | Angličtina |
| Vazba: | Mixed media product |
| Počet stran: | 689 |
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