Next Generation HALT and HASS
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Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.
| Autor: | Gray, Kirk A.; Paschkewitz, John James |
| Nakladatel: | John Wiley & Sons Inc |
| ISBN: | 9781118700235 |
| Rok vydání: | 2016 |
| Jazyk : | Angličtina |
| Vazba: | Hardback |
| Počet stran: | 296 |
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