Root Cause Analysis
2730 Kč 2 817 Kč
Sleva až 70% u třetiny knih
Autor: | Latino, Mark A. (President, Reliability Center, Inc., Hopewell, VA); Latino, Robert J. (CEO, Reliability Center, Inc., H |
Nakladatel: | Taylor & Francis Ltd |
ISBN: | 9781138332454 |
Rok vydání: | CZE |
Jazyk : | Čeština |
Vazba: | CZE |
Počet stran: | CZE |
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