Fundamentals of Electromigration-Aware Integrated Circuit Design
36
%
2175 Kč 3 406 Kč
Odesíláme do 1 až 2 týdnů
Sleva až 70% u třetiny knih
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Autor: | Lienig, Jens |
| Nakladatel: | Springer International Publishing AG |
| ISBN: | 9783319735573 |
| Rok vydání: | 2018 |
| Jazyk : | Angličtina |
| Vazba: | Hardback |
| Počet stran: | 159 |
Mohlo by se vám také líbit..
-
Electronics for Embedded Systems
Bindal, Ahmet
-
Measurement, Testing and Sensor Tech...
Czichos, Horst
-
8051 Microcontrollers
Gimenez, Salvador Pinillos
-
Cloud Computing
Sehgal, Naresh Kumar; Bhatt, Pramod Chandra P.
-
Off-Grid Electrical Systems in Devel...
Louie, Henry
-
Future Telco
-
Medical Robotics
Schweikard, Achim; Ernst, Floris
-
Designing with Xilinx (R) FPGAs
-
Elements of Robotics
Faridi, Ben
-
Tantalum and Niobium-Based Capacitors
Freeman, Yuri
-
Building an Effective IoT Ecosystem ...
Sinha, Sudhi R.; Park, Youngchoon
-
Electrical Machines and Drives
Melkebeek, Jan A.
-
Computing Platforms for Software-Def...
-
Proceedings of International Symposi...
-
Robust Control Design for Active Dri...
Gaspar, Peter; Szabo, Zoltan; Bokor, Jozsef; Nemeth, Balazs
-
The Physics of Semiconductor Devices