Common Diagnostic Pitfalls in Thyroid Cytopathology
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This text provides a comprehensive review of the most frequently encountered diagnostic pitfalls in thyroid cytopathology.
| Autor: | Adeniran, Adebowale; Chhieng, David F. |
| Nakladatel: | Springer International Publishing AG |
| ISBN: | 9783319316000 |
| Rok vydání: | 2016 |
| Jazyk : | Angličtina |
| Vazba: | Hardback |
| Počet stran: | 343 |
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