Scanning Electron Microscopy and X-Ray Microanalysis
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| Autor: | Ritchie, Nicholas W. M.; Newbury, Dale; Joy, David C.; Michael, Joseph; Goldstein, Joseph; Scott, John Henry |
| Nakladatel: | Springer-Verlag New York Inc. |
| ISBN: | 9781493966745 |
| Rok vydání: | 2017 |
| Jazyk : | Angličtina |
| Vazba: | Mixed media product |
| Počet stran: | 550 |
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