Scanning Electron Microscopy and X-Ray Microanalysis
5
%
2512 Kč 2 645 Kč
Sleva až 70% u třetiny knih
Autor: | Ritchie, Nicholas W. M.; Newbury, Dale; Joy, David C.; Michael, Joseph; Goldstein, Joseph; Scott, John Henry |
Nakladatel: | Springer-Verlag New York Inc. |
ISBN: | 9781493966745 |
Rok vydání: | 2017 |
Jazyk : | Angličtina |
Vazba: | Mixed media product |
Počet stran: | 550 |
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