Sample Preparation Handbook for Transmission Electron Microscopy
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This handbook is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.
| Autor: | Ayache, Jeanne; Beaunier, Luc; Boumendil, Jacqueline; Ehret, Gabrielle; Laub, Daniele |
| Nakladatel: | Springer-Verlag New York Inc. |
| ISBN: | 9781441960870 |
| Rok vydání: | 2010 |
| Jazyk : | Angličtina |
| Vazba: | Book |
| Počet stran: | 670 |
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