Scanning Electron Microscopy and X-Ray Microanalysis
9
%
1887 Kč 2 076 Kč
Sleva až 70% u třetiny knih
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
| Autor: | Goldstein Joseph |
| Nakladatel: | Springer-Verlag New York Inc. |
| ISBN: | 9781461349693 |
| Rok vydání: | 2013 |
| Jazyk : | Angličtina |
| Vazba: | Paperback / softback |
| Počet stran: | 689 |
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