Scanning Electron Microscopy and X-Ray Microanalysis
9
%
1887 Kč 2 076 Kč
Sleva až 70% u třetiny knih
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
| Autor: | Goldstein Joseph |
| Nakladatel: | Springer-Verlag New York Inc. |
| ISBN: | 9781461349693 |
| Rok vydání: | 2013 |
| Jazyk : | Angličtina |
| Vazba: | Paperback / softback |
| Počet stran: | 689 |
Mohlo by se vám také líbit..
-
The Path of Insight Meditation
Goldstein Joseph
-
The Experience of Insight
Goldstein Joseph
-
Medical Informatics
-
An Introduction to Homological Algebra
Rotman, Joseph J.
-
Mathematics and Its History
Stillwell, John
-
Exploring Science Through Science Fi...
Luokkala, Barry B.
-
Handbook of Neurochemistry and Molec...
-
Geometry
Borovik, Alexandre V.; White, Neil; Gelfand, Israel M.
-
Modern Food Microbiology
Jay, James M.; Loessner, Martin J.; Golden, David A.
-
Instructional Design: The ADDIE Appr...
Branch, Robert Maribe
-
Mathematical Biology
Murray, James T.
-
Naive Lie Theory
Stillwell, John
-
Rare Earth
Ward, Peter
-
An Introduction to Mathematical Crypt...
Hoffstein, Jeffrey; Pipher, Jill; Silverman, Joseph H.
-
A First Course in Modular Forms
Diamond, Fred; Shurman, Jerry
-
Pattern Recognition and Machine Lear...
Bishop, Christopher M.